• DocumentCode
    2438307
  • Title

    Divide and conquer based Fast Shmoo algorithms

  • Author

    Patten, Peter

  • Author_Institution
    Syst. on a Chip Bus. Unit, Agilent Technol., Germany
  • fYear
    2004
  • fDate
    26-28 Oct. 2004
  • Firstpage
    197
  • Lastpage
    202
  • Abstract
    Shmoo-plots are a powerful characterization technique in digital IC testing. Utilization and number of ICs exposed are limited by high execution times. This work presents an effective Fast-Shmoo algorithm to accelerate device characterization. The robust optimization concept is adapted to specific device characterization needs and reduce test execution times significantly.
  • Keywords
    circuit optimisation; digital integrated circuits; divide and conquer methods; integrated circuit testing; Fast Shmoo algorithms; Shmoo plots; device characterization; digital IC testing; divide and conquer algorithms; optimization; time reduction; Area measurement; Coordinate measuring machines; Digital integrated circuits; Error analysis; Integrated circuit testing; Life estimation; Performance evaluation; Random access memory; Semiconductor device measurement; Shape measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2004. Proceedings. ITC 2004. International
  • Print_ISBN
    0-7803-8580-2
  • Type

    conf

  • DOI
    10.1109/TEST.2004.1386953
  • Filename
    1386953
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2438307