DocumentCode :
2438311
Title :
Application of silicon diode for temperature measurements in strong microwave fields
Author :
Afonin, D.G. ; Kanunov, Ye.R.
Author_Institution :
Phys. Dept., Moscow State Univ., Russia
fYear :
2003
fDate :
8-12 Sept. 2003
Firstpage :
485
Lastpage :
486
Abstract :
This paper discusses the application of silicon diode in the research of EM distribution and temperature measurements in strong microwave fields. Advantages of using silicon diodes for these purposes are outlined.
Keywords :
electromagnetic fields; microwave measurement; semiconductor diodes; temperature measurement; temperature sensors; EM distribution; microwave field; silicon diode; temperature measurement; Diodes; Electromagnetic measurements; IEEE catalog; Microwave measurements; Organizing; Silicon; Space technology; Temperature distribution; Temperature measurement; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Telecommunication Technology, 2003. CriMiCo 2003. 13th International Crimean Conference
Conference_Location :
Sevastopol, Crimea, Ukraine
Print_ISBN :
966-7968-26-X
Type :
conf
DOI :
10.1109/CRMICO.2003.158905
Filename :
1256590
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2438311
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