• DocumentCode
    2438351
  • Title

    Digital testing and reliability education (DTRE) computer tool

  • Author

    Kubatova, Hana ; Jelinek, Radek

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Czech Tech. Univ., Praha, Czech Republic
  • Volume
    3
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    1227
  • Abstract
    This paper describes our computer tool for the educational course "Diagnostics and Reliability". It consists of three programs and a web presentation. It serves for education, practical lessons and exercises but not for replacing it. The web presentation contains theoretical parts of each topic, user manuals, examples and programs for experiments to perform. The simple JeL language based on Boolean equations can describe the structure of a tested circuit. The TEST program generates the complete structural detection test set. The pseudo-random test can be generated by the HILDO program and next the test fault coverage can be studied and a fault dictionary can be created. The RELIABILITY program computes basic reliability characteristics from a graphical block model. The brief description of the JeL language, these three programs and the structure of our Digital Testing and Reliability Education (DTRE) tool are presented.
  • Keywords
    circuit reliability; circuit testing; computer aided instruction; digital circuits; educational courses; electronic engineering computing; electronic engineering education; fault diagnosis; logic testing; Boolean equations; DTRE computer tool; HILDO program; JeL language; RELIABILITY program; TEST program; Web presentation; diagnostics/reliability course; digital testing education; engineering education; fault dictionary creation; graphical block model; pseudo-random test generation; reliability characteristics; reliability education; structural detection test set; test fault coverage; Circuit faults; Circuit testing; Computer science; Computer science education; Design for testability; Educational programs; Equations; Natural languages; Reliability engineering; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems, 2002. 9th International Conference on
  • Print_ISBN
    0-7803-7596-3
  • Type

    conf

  • DOI
    10.1109/ICECS.2002.1046475
  • Filename
    1046475