Quasi-oscillation based test for improved prediction of analog performance parameters

Author

Raghunathan, Ashwin ; Chun, Ji Hwan ; Abraham, Jacob A. ; Chatterjee, Abhijit

Author_Institution

Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA

fYear

2004

fDate

26-28 Oct. 2004

Firstpage

252

Lastpage

261

Abstract

Oscillation based test (OBT) techniques in the past have focussed on detecting the existence of catastrophic and parametric faults. Recent work on predictive oscillation based test (POBT) has used OBT techniques to predict the performance parameters of the circuit under test (CUT). However, this technique cannot be used to predict the performance parameters of the CUT for process parameter variations that cause a loss of oscillation in test mode. This work presents a novel predictive quasi-oscillation based technique (PQOBT) to extend the usability of POBT over a wide range of process parameter variations with minimal test generation overhead.

Keywords

analogue integrated circuits; catastrophe theory; circuit oscillations; fault diagnosis; integrated circuit testing; CUT; analog performance parameters; catastrophic fault detect; circuit under test; parametric fault detection; predictive oscillation based test; predictive quasioscillation based technique; process parameter variations; Analog integrated circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Integrated circuit measurements; Integrated circuit testing; Jacobian matrices; Oscillators; Subcontracting;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2004. Proceedings. ITC 2004. International

Print_ISBN

0-7803-8580-2

Type

conf

DOI

10.1109/TEST.2004.1386959

Filename

1386959