• DocumentCode
    2438493
  • Title

    Research on Technology Transfer Readiness Level and Its Application in University Technology Innovation Management

  • Author

    Juan, Zhang ; Wei, Liu ; Xiamei, Peng

  • Author_Institution
    Sch. of Bus. Adm., North China Electr. Power Univ., Beijing, China
  • fYear
    2010
  • fDate
    7-9 May 2010
  • Firstpage
    1904
  • Lastpage
    1907
  • Abstract
    Technology Readiness Level (TRL) is an effective risk management measure used by NASA and DoD. Based on the idea of TRL, this paper developed and refined a new concept of University Technology Transfer Readiness Level (UTTRL). UTTRL comprises five distinct attributes, including technology maturity attribute, technology advancement attribute, technology demand attribute, technology criticality attribute, and stage in the industry life cycle. Each attribute is further divided into several levels with definitions and brief descriptions. The calculation of UTTRL-Index is also introduced in the paper. UTTRL explores a set of transfer readiness criteria and provides an approach to assess the preparation of university technology achievements for transfer. It can be used in the university technology innovation management as a risk management tool.
  • Keywords
    educational technology; innovation management; risk management; technology transfer; UTTRL-Index; industry life cycle; risk management measure; technology advancement attribute; technology criticality attribute; technology demand attribute; technology maturity attribute; technology transfer readiness level; university technology innovation management; Indexes; Industries; NASA; Risk management; Technological innovation; Technology transfer; US Department of Defense; Technology Innovation; Technology Transfer; Technology Transfer Readiness Level; University; risk management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    E-Business and E-Government (ICEE), 2010 International Conference on
  • Conference_Location
    Guangzhou
  • Print_ISBN
    978-0-7695-3997-3
  • Type

    conf

  • DOI
    10.1109/ICEE.2010.481
  • Filename
    5592775