Title :
A novel approach to IC, package and board co-optimization
Author :
Brist, Gary ; Park, John
Author_Institution :
Intel, Hillsboro, OR, USA
Abstract :
Today´s leading edge IC (Integrated Circuit) packaging technologies require a co-design methodology that streamlines the planning, assembly, and optimization of the IC die, package substrate, and PCB (Printed Circuit Board) while assimilating the physical and logical interactions between each design domain. Package pin-outs and other packaging interconnect structures, such as bridges and interposers, must not only be optimized based on die level constraints, but also on the constraints, escape routing, and pin-outs of critical interfaces on the PCB. In short, the concept of throwing your design over the wall and letting the next guy deal with it, no longer works. This paper outlines a methodology for the concurrent design and optimization of IC dies, packages and PCBs.
Keywords :
integrated circuit packaging; printed circuits; IC die; integrated circuit packaging; package substrate; printed circuit board; Abstracts; Integrated circuit modeling; Optimization; Pins; Routing; Substrates; Chip-Package Interaction; Co-Design; Path Finding;
Conference_Titel :
Quality Electronic Design (ISQED), 2015 16th International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4799-7580-8
DOI :
10.1109/ISQED.2015.7085478