• DocumentCode
    2438620
  • Title

    Recent paraxial diode experiments on RITS-6

  • Author

    Hahn, K. ; Oliver, B.V. ; Cordova, S. ; Johnston, M.D. ; Leckbee, J. ; Molina, I. ; Portillo, S. ; Bittlestone, D.J. ; Cooper, G. ; McLean, J. ; Bruner, N. ; Rose, D.V. ; Welch, D.R. ; Schamiloglu, E.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM
  • fYear
    2008
  • fDate
    15-19 June 2008
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given. Development of intense electron beam-driven diodes for flash X-ray radiography is being carried out at 7.5-12 MV on the RITS-6 accelerator at Sandia National Laboratories. One of several diodes under investigation is the paraxial diode, which employs a gas-filled transport cell to focus an electron beam onto a high-atomic-number target to generate X-rays. Three key objectives are to produce a small spot size, <5 mm, high forward-directed dose, >600 rads at 1 m, and efficiently couple this relatively high-impedance diode to the lower-impedance RITS-6 accelerator. Particle-in-cell (PIC) simulations have shown that the primary limitation in spot size is due to the finite decay of the plasma return current which causes the beam focal location to sweep axially during the timescale of the pulse, hence leading to an increasing spot size. Time-resolved measurements of the spot size which convey this trend are reported. Interpretation of these results was aided by PIC simulations in which additional physics was included. Other outstanding issues for the paraxial diode on RITS-6 are also presented which include electron powerflow coupling to the diode, cavity modes which may affect focusing, and gas-breakdown models. Measurements of dose, dose rate, time-integrated (and time-resolved) spot size, and current are reported for experimental results at 7.5 and 10.5 MV.
  • Keywords
    diodes; electron beam focusing; radiography; RITS-6 accelerator; beam focal location; cavity modes; dose rate; electron beam focus; electron beam-driven diodes; electron powerflow coupling; flash X-ray radiography; forward-directed dose; gas-breakdown models; gas-filled transport cell; high-atomic-number target; paraxial diode; particle-in-cell simulations; plasma return current; time-integrated spot size; time-resolved measurements; voltage 7.5 MV to 12 MV; Diodes; Electron accelerators; Electron beams; Laboratories; Particle accelerators; Plasma accelerators; Plasma measurements; Plasma simulation; Radiography; Size measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2008. ICOPS 2008. IEEE 35th International Conference on
  • Conference_Location
    Karlsruhe
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4244-1929-6
  • Electronic_ISBN
    0730-9244
  • Type

    conf

  • DOI
    10.1109/PLASMA.2008.4590851
  • Filename
    4590851