DocumentCode :
2438814
Title :
Open architecture test system: system architecture and design
Author :
Rajsuman, Rochit ; Noriyuki, Masuda
Author_Institution :
Advantest America Corp., Santa Clara, CA, USA
fYear :
2004
fDate :
26-28 Oct. 2004
Firstpage :
403
Lastpage :
412
Abstract :
The open architecture test system provides a method and framework under which software and instruments of different vendors can be developed and integrated into an ATE. In This work, we describe the overall architecture and design of the system. First we describe the architecture and the control mechanism for the overall system and for individual test-sites. Data and command communication mechanism among these control elements is explained. After this general structure, we describe how this architecture allows deployment of third party instruments and modules, what are the interfaces, how system is configured and how correct operation of the system is ensured after plugging-in a third party module.
Keywords :
automatic test equipment; hardware-software codesign; integrated circuit testing; open systems; ATE; command communication mechanism; data communication mechanism; open architecture test system; system architecture; system design; third party instruments; third party modules; Application specific integrated circuits; Communication system control; Computer architecture; Costs; Hardware; Instruments; Integrated circuit testing; Logic testing; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
Type :
conf
DOI :
10.1109/TEST.2004.1386976
Filename :
1386976
Link To Document :
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