DocumentCode
2438847
Title
Extending STIL 1450 standard for test program flow
Author
Dowding, David ; Wahl, Ernie ; Organ, Don
Author_Institution
Agilent Technol. Inc., Loveland, CO, USA
fYear
2004
fDate
26-28 Oct. 2004
Firstpage
423
Lastpage
431
Abstract
The IEEE P1450.4 test program flow extension to the STIL standard provides a test program flow description that allow full program generation by design-to-test automation tools, the portability and interchange of test programs between different ATE platforms, and enable greater reuse of program components. With the recent adoption of IEEE 1450 STIL and its extensions, the test program flow extension provide the semiconductor industry the means to greater automation and decrease the time-to-market aspects of new product introductions.
Keywords
IEEE standards; automatic test equipment; automatic test pattern generation; design for testability; time to market; ATE platforms; IEEE P1450.4; STIL 1450 standard; design to test automation tools; portability; program generation; semiconductor industry; test program flow extension; time to market; Automatic testing; Design automation; Environmental economics; Manufacturing automation; Manufacturing industries; Semiconductor device manufacture; Semiconductor device testing; Standards development; System testing; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN
0-7803-8580-2
Type
conf
DOI
10.1109/TEST.2004.1386978
Filename
1386978
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