Title :
Extending STIL 1450 standard for test program flow
Author :
Dowding, David ; Wahl, Ernie ; Organ, Don
Author_Institution :
Agilent Technol. Inc., Loveland, CO, USA
Abstract :
The IEEE P1450.4 test program flow extension to the STIL standard provides a test program flow description that allow full program generation by design-to-test automation tools, the portability and interchange of test programs between different ATE platforms, and enable greater reuse of program components. With the recent adoption of IEEE 1450 STIL and its extensions, the test program flow extension provide the semiconductor industry the means to greater automation and decrease the time-to-market aspects of new product introductions.
Keywords :
IEEE standards; automatic test equipment; automatic test pattern generation; design for testability; time to market; ATE platforms; IEEE P1450.4; STIL 1450 standard; design to test automation tools; portability; program generation; semiconductor industry; test program flow extension; time to market; Automatic testing; Design automation; Environmental economics; Manufacturing automation; Manufacturing industries; Semiconductor device manufacture; Semiconductor device testing; Standards development; System testing; USA Councils;
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
DOI :
10.1109/TEST.2004.1386978
