• DocumentCode
    243892
  • Title

    Exploring Kriging for Fast and Accurate Design Optimization of Nanoscale Analog Circuits

  • Author

    Okobiah, O. ; Mohanty, S.P. ; Kougianos, E.

  • Author_Institution
    NanoSystem Design Lab., Univ. of North Texas, Denton, TX, USA
  • fYear
    2014
  • fDate
    9-11 July 2014
  • Firstpage
    244
  • Lastpage
    247
  • Abstract
    The increasing complexity of modern electronic devices driven by consumer demand and technological advancements presents significant challenges for designers. The reduced feature size and increased capabilities lead to more complex designs as more sub-systems are packed into a single chip. Traditional synthesis and optimization methods which involve CAD tools for accurate simulation are computationally time expensive and even become infeasible especially in designs using nanoelectronic technology due to increased design factors and the exponentially increasing design space. The current objective is to explore techniques that produce optimal designs while reducing the design effort. Metamodeling techniques have been used in this respect to reduce the cost of manual iterative circuit sizing during synthesis. Existing metamodeling techniques however are unable to capture the effects of process variation which are dominant in deep nanometer regions. This work explores Kriging techniques for fast and accurate design optimization of nanoscale analog circuits.
  • Keywords
    analogue integrated circuits; nanoelectronics; optimisation; statistical analysis; Kriging; design optimization; manual iterative circuit sizing; metamodeling techniques; nanoscale analog circuits; optimal designs; process variation; Algorithm design and analysis; Artificial neural networks; Computational modeling; Metamodeling; Optimization; Phase locked loops; Analog Mixed-Signal (AMS); Geostatistics; Kriging; Nano-CMOS; Neural Network; Optimization; Process Variation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI (ISVLSI), 2014 IEEE Computer Society Annual Symposium on
  • Conference_Location
    Tampa, FL
  • Print_ISBN
    978-1-4799-3763-9
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2014.12
  • Filename
    6903368