• DocumentCode
    2439008
  • Title

    Z-DFD: design-for-diagnosability based on the concept of Z-detection

  • Author

    Pomeranz, Irith ; Venkataraman, Srikanth ; Reddy, Sudhakar M.

  • Author_Institution
    Sch. of ECE, Purdue Univ., West Lafayette, IN, USA
  • fYear
    2004
  • fDate
    26-28 Oct. 2004
  • Firstpage
    489
  • Lastpage
    497
  • Abstract
    We address the problem of design-for-diagnosability, i.e., improving the accuracy of fault diagnosis or reducing its complexity through the insertion of observation points. To perform design-for-diagnosability efficiently, we use a procedure developed earlier for computing the number of fault pairs, NP, that are not guaranteed to be distinguished by a given test set. By using the concept of z -detection, NP can be computed efficiently without enumerating fault pairs and without performing non-fault dropping fault simulation. We study the possibility of increasing the diagnosability of a circuit by inserting observation points so as to reduce NP. Our results include the following. (1) We find experimentally the number of observation points that need to be inserted in order to achieve a close-to-minimum value for NP. (2) We describe an efficient procedure for inserting a given number of observation points so as to reduce NP. We present experimental results for benchmark circuits to demonstrate the accuracy of using NP to guide a design-for-diagnosability process.
  • Keywords
    benchmark testing; circuit complexity; circuit simulation; combinational circuits; design for testability; fault simulation; logic design; logic testing; benchmark circuits; circuit complexity; combinational circuits; design for diagnosability; fault diagnosis; fault pairs; fault simulation; observation points; z -detection; Circuit faults; Circuit simulation; Circuit testing; Cities and towns; Computational modeling; Electrical fault detection; Fault detection; Fault diagnosis; Performance evaluation; Process design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2004. Proceedings. ITC 2004. International
  • Print_ISBN
    0-7803-8580-2
  • Type

    conf

  • DOI
    10.1109/TEST.2004.1386985
  • Filename
    1386985