Title :
Characterization of risky projects based on project managers evaluation
Author :
Mizuno, Osamu ; Kikuno, Tohru ; Takagi, Yasunari ; Sakamoto, Keishi
Author_Institution :
Graduate Sch. of Eng. Sci., Osaka Univ., Japan
Abstract :
During the process of software development, senior managers often find indications that projects are risky and take appropriate actions to recover them from this dangerous status. If senior managers fail to detect such risks, it is possible that such projects may collapse completely. In this paper, we propose a new scheme for the characterization of risky projects based on an evaluation by the project manager. In order to acquire the relevant data to make such an assessment, we first designed a questionnaire from five view-points within the projects: requirements, estimations, team organization, planning capability and project management activities. Each of these viewpoints consisted of a number of concrete questions. We then analyzed the responses to the questionnaires as provided by project managers by applying a logistic regression analysis. That is, we determined the coefficients of the logistic model from a set of the questionnaire responses. The experimental results using actual project data in Company A showed that 27 projects out of 32 were predicted correctly. Thus we would expect that the proposed characterizing scheme is the first step toward predicting which projects are risky at an early phase of the development
Keywords :
project management; risk management; software development management; logistic regression analysis; planning capability; project management; project managers evaluation; requirements; risky projects; software development; team organization; Concrete; Engineering management; Logistics; Permission; Programming; Project management; Regression analysis; Risk management; Software development management; Software engineering;
Conference_Titel :
Software Engineering, 2000. Proceedings of the 2000 International Conference on
Conference_Location :
Limerick
Print_ISBN :
1-58113-206-9
DOI :
10.1109/ICSE.2000.870429