Title :
Fault diagnosis in designs with convolutional compactors
Author :
Mrugalski, Grzegorz ; Pogiel, Artur ; Rajski, Janusz ; Tyszer, Jerzy ; Wang, Chen
Author_Institution :
Mentor Graphics Corp., Beaverton, OR, USA
Abstract :
The paper introduces a new non-adaptive fault diagnosis technique for scan-based designs. The proposed scheme guarantees accurate and time-efficient identification of failing scan cells based on results of a convolutional test response compaction.
Keywords :
boundary scan testing; built-in self test; fault diagnosis; integrated circuit testing; built-in self test; convolutional compactors; convolutional test response compaction; failing scan cells; integrated circuit testing; nonadaptive fault diagnosis technique; scan based designs; time efficient identification; Built-in self-test; Circuit faults; Circuit testing; Compaction; Convolution; Fault diagnosis; Graphics; Logic devices; Registers; Silicon;
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
DOI :
10.1109/TEST.2004.1386986
