DocumentCode :
243914
Title :
FinCACTI: Architectural Analysis and Modeling of Caches with Deeply-Scaled FinFET Devices
Author :
Shafaei, Alireza ; Yanzhi Wang ; Xue Lin ; Pedram, Massoud
Author_Institution :
Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
fYear :
2014
fDate :
9-11 July 2014
Firstpage :
290
Lastpage :
295
Abstract :
This paper presents FinCACTI, a cache modeling tool based on CACTI which also supports deeply-scaled FinFET devices as well as more robust SRAM cells. In particular, FinFET devices optimized using advanced device simulators for 7nm process serve as the case study of the paper. Based on this 7nm FinFET process, characteristics of 6T and 8T SRAMs are calculated, and comparison results show that under the same stability requirements the 8T cell has smaller area and leakage power. SRAM and technological parameters of the 7nm FinFET are then incorporated into FinCACTI. According to architecture-level simulations, the 8T SRAM is suggested as the choice of memory cell for 7nm FinFET. Moreover, a 4MB cache in 7nm FinFET compared with 22nm (32nm) CMOS under same access latencies achieves 5x (9x) and 11x (24x) reduction in read energy and area, respectively.
Keywords :
CMOS integrated circuits; MOSFET; SRAM chips; cache storage; semiconductor device models; CMOS process; FinCACTI; architectural analysis; architecture-level simulations; cache modeling tool; deeply-scaled FinFET devices; robust SRAM cells; size 7 nm; CMOS integrated circuits; Capacitance; FinFETs; Logic gates; SRAM cells; Semiconductor device modeling; CACTI; Cache Modeling; FinFET devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI (ISVLSI), 2014 IEEE Computer Society Annual Symposium on
Conference_Location :
Tampa, FL
Print_ISBN :
978-1-4799-3763-9
Type :
conf
DOI :
10.1109/ISVLSI.2014.94
Filename :
6903378
Link To Document :
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