FDPIC: Generation of Functional Test Sequences Based on Fault-Dependent Primary Input Cubes

A subclass of efficient simulation-based sequential test generation procedures are guided by information about primary input values that effective test subsequences should use. This information is represented by a primary input cube c. In all the earlier procedures that are based on this concept, the computation of c is fault-independent. This paper introduces an approach for a fault-dependent computation of c. This allows the test generation procedure to generate test subsequences that match the detection conditions of specific faults, thus increasing the fault coverage that it can achieve. The computation of the primary input cube c for a fault f is based on a process that unspecifies a primary input subsequence, which does not detect f, in order to identify values that need to be avoided in a test subsequence for f. These values are used in the construction of c for f. The paper also discusses the applicability of the fault-dependent primary input cubes to the built-in generation of functional broadside tests.