Title :
Application-dependent diagnosis of FPGAs
Author :
Tahoori, Mehdi Baradaran
Author_Institution :
Northeastern Univ., Boston, MA, USA
Abstract :
A new technique for diagnosis of faults in the interconnects and logic blocks of an arbitrary design implemented on an FPGA is presented. This work is complementary to application-dependent detection methods for FPGAs. This technique can uniquely identify any single bridging, open, or stuck-at fault in the interconnect as well as any single functional fault in the logic blocks. The number of test configurations for interconnect diagnosis is logarithmic to the size of the mapped design, whereas logic diagnosis is performed in only one test configuration.
Keywords :
fault diagnosis; field programmable gate arrays; logic testing; FPGA; application dependent detection methods; application dependent diagnosis; bridging fault identification; fault diagnosis; interconnect diagnosis; logic blocks; logic diagnosis; open fault identification; single functional fault; stuck-at fault identification; test configurations; Circuit faults; Fault diagnosis; Fault tolerant systems; Field programmable gate arrays; Integrated circuit interconnections; Logic testing; Manufacturing; Programmable logic arrays; Reconfigurable logic; System testing;
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
DOI :
10.1109/TEST.2004.1387002
