DocumentCode
2439473
Title
Improving the performance of hypervisor-based fault tolerance
Author
Zhu, Jun ; Dong, Wei ; Jiang, Zhefu ; Shi, Xiaogang ; Xiao, Zhen ; Li, Xiaoming
Author_Institution
Sch. of Electron. Eng. & Comput. Sci., Peking Univ., Beijing, China
fYear
2010
fDate
19-23 April 2010
Firstpage
1
Lastpage
10
Abstract
Hypervisor-based fault tolerance (HBFT), a checkpoint-recovery mechanism, is an emerging approach to sustaining mission-critical applications. Based on virtualization technology, HBFT provides an economic and transparent solution. However, the advantages currently come at the cost of substantial overhead during failure-free, especially for memory intensive applications. This paper presents an in-depth examination of HBFT and options to improve its performance. Based on the behavior of memory accesses among checkpointing epochs, we introduce two optimizations, read fault reduction and write fault prediction, for the memory tracking mechanism. These two optimizations improve the mechanism by 31.1% and 21.4% respectively for some application. Then, we present software-superpage which efficiently maps large memory regions between virtual machines (VM). By the above optimizations, HBFT is improved by a factor of 1.4 to 2.2 and it achieves a performance which is about 60% of that of the native VM.
Keywords
checkpointing; fault tolerant computing; optimisation; virtual machines; checkpoint-recovery mechanism; hypervisor-based fault tolerance; memory intensive applications; memory tracking; mission-critical applications; optimization; read fault reduction; software superpage; virtual machines; virtualization; write fault prediction; Application software; Checkpointing; Fault tolerance; Fault tolerant systems; Maintenance; Mission critical systems; Read-write memory; Virtual machine monitors; Virtual machining; Virtual manufacturing; Checkpoint; Fault Tolerance; Hypervisor; Recovery; Virtualization;
fLanguage
English
Publisher
ieee
Conference_Titel
Parallel & Distributed Processing (IPDPS), 2010 IEEE International Symposium on
Conference_Location
Atlanta, GA
ISSN
1530-2075
Print_ISBN
978-1-4244-6442-5
Type
conf
DOI
10.1109/IPDPS.2010.5470357
Filename
5470357
Link To Document