• DocumentCode
    2439485
  • Title

    n-ZnSe/p-GaAs heterojunction solar cells

  • Author

    Blieske, U. ; Kampschulte, T. ; Bauknecht, A. ; Saad, M. ; Sollner, J. ; Krost, A. ; Schatke, K. ; Lux-Steiner, M.Ch.

  • Author_Institution
    Hahn-Meitner-Inst., Berlin, Germany
  • fYear
    1997
  • fDate
    Sept. 29 1997-Oct. 3 1997
  • Firstpage
    939
  • Lastpage
    942
  • Abstract
    For PV applications, epitaxial layers of n-ZnSe were grown by metal-organic vapour phase epitaxy (MOVPE) at 340°C on GaAs(001) substrates. n-type net carrier concentration in the range between 1017-1019 cm-3 was demonstrated. By increasing the doping concentration, the double crystal X-ray diffraction full width at half maximum of 1.2 μm thick ZnSe-layers increased from 400" to 600". A first n-ZnSe/p-GaAs solar cell achieved an open circuit voltage of 706 mV, a fill factor of 65% and a short circuit current density of 10 mA cm-2 (total area, ELH-lamp, 100 mW cm-2, no AR-coating). JSC was increased by 4 mA cm-2 by depositing sputtered n+-ZnO on the n-ZnSe layer. In order to improve the PV performance further, n-ZnSe will be grown on GaAs buffer layers, the doping profile will be optimised systematically and MgF2 will be deposited on the ZnO layer
  • Keywords
    II-VI semiconductors; III-V semiconductors; gallium arsenide; p-n heterojunctions; semiconductor epitaxial layers; semiconductor growth; solar cells; vapour phase epitaxial growth; zinc compounds; 1.2 mum; 340 C; 706 mV; PV applications; PV performance improvement; X-ray diffraction; ZnSe-GaAs; ZnSe/GaAs heterojunction solar cells; buffer layers; doping concentration; doping profile; epitaxial layers growth; fill factor; metal-organic vapour phase epitaxy; open circuit voltage; short circuit current density; Doping; Epitaxial growth; Epitaxial layers; Gallium arsenide; Heterojunctions; Photovoltaic cells; Short circuit currents; Substrates; Voltage; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
  • Conference_Location
    Anaheim, CA, USA
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3767-0
  • Type

    conf

  • DOI
    10.1109/PVSC.1997.654242
  • Filename
    654242