Title :
An Approach to Supply Simulations of the Functional Environment of ECUs for Hardware-in-the-Loop Test Systems Based on EE-architectures Conform to AUTOSAR
Author :
Hillenbrand, Martin ; Muller-Glaser, Klaus D.
Author_Institution :
Inst. for Inf. Process. Technol., Karlsruhe Inst. of Technol. (KIT), Karlsruhe, Germany
Abstract :
Todaypsilas vehicles include a complex network of programmable electronic control units with software components. A vehiclepsilas electric and electronic (EE) architecture has to be modeled in an early design phase to evaluate design alternatives. The tool PREEvision offers possibilities to model EE-architectures considering feature function networks, function networks, component networks as well as wiring harness and the respective mappings. The software architecture specified by AUTOSAR separates hardware dependent and hardware independent software modules. This allows the mapping of hardware independent software applications to different hardware platforms. Hardware-in-the-Loop (HiL) is an established technology for testing electronic control units (ECU) and to assure quality. HiL-test-systems (HiL-TS) simulate the ECUpsilas functional environment (car, driver, road, tires, etc.) and additionally offers the possibility to insert logical faults as well as electrical faults (short circuit, open load, etc.). Mostly, this HiL-simulation is individually engineered for every single ECU.This paper introduces a concept for the automated support of such simulations. This includes the derivation of relevant information from the model of the EE-architecture as well as the portation of the AUTOSAR software architecture to the HiL-TS. Following this concept, engineering costs can be reduced and the quality and correctness of the simulation increased.
Keywords :
electronic equipment testing; software architecture; traffic engineering computing; vehicles; AUTOSAR software architecture; EE-architecture; component network; electrical fault; function network; hardware independent software application; hardware-in-the-loop test system; logical fault; programmable electronic control unit testing; vehicle electric and electronic architecture; Application software; Circuit faults; Circuit simulation; Complex networks; Computer architecture; Hardware; Software architecture; System testing; Vehicles; Wiring; AUTOSAR; EE-architecture; Hardware in the Loop; HiL; Simulation;
Conference_Titel :
Rapid System Prototyping, 2009. RSP '09. IEEE/IFIP International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-0-7695-3690-3
DOI :
10.1109/RSP.2009.14