Title :
Procedure of measurement of ferroelectric films parameters using open resonator method
Author :
Buslov, O.Y. ; Keys, V.N. ; Kozyrev, A.B. ; Kotelnikov, I.V.
Author_Institution :
St. Petersburg Nat. Electrotech. Univ., Russia
Abstract :
Presented in this paper are the measurements of ferroelectric film parameters (loss tangent, dielectric constant) based on quasioptical U-band resonator. The results of measurements of multiple structures and ferroelectric film parameters at frequency 50 GHz are presented.
Keywords :
dielectric loss measurement; dielectric losses; dielectric resonators; ferroelectric thin films; millimetre wave measurement; optical resonators; permittivity; 50 GHz; dielectric constant; ferroelectric films parameter measurement; loss tangent; multiple film structure; open resonator method; quasioptical U-band resonator; Dielectric loss measurement; Dielectric measurements; Ferroelectric films; Hidden Markov models; IEEE catalog; Iron; Millimeter wave technology; Mirrors; Organizing; Pulse width modulation;
Conference_Titel :
Microwave and Telecommunication Technology, 2003. CriMiCo 2003. 13th International Crimean Conference
Conference_Location :
Sevastopol, Crimea, Ukraine
Print_ISBN :
966-7968-26-X
DOI :
10.1109/CRMICO.2003.158981
