Investigation of the near-field interaction of the open-ended of the coaxial waveguide

In this paper we have studied sensitivity and resolving ability of microscope and its dependence on dimensions of the outward-projecting inner conductor of the coaxial probe. For this purpose we have designed the near-field microscope, based on coaxial cable length with salient inner conductor. When thickness of the dielectric layer increases the response of the microscope to the split in metal first grows and then goes to zero. The qualitative explanation of our study is presented.