Title :
An Analog On-Line Gain Calibration Loop for RF Amplifiers
Author :
Yi-Keng Hsieh ; Ya-Ru Wu ; Po-Chih Ku ; Liang-Hung Lu
Author_Institution :
Dept. of Electr. Eng. & Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
This paper presents an analog on-line gain calibration loop for radio-frequency (RF) amplifiers. In the proposed calibration scheme, the gain of an RF amplifier is determined by programmable resistor ratios of two transimpedance amplifiers (TIAs), while the corresponding control voltage is generated through a differential difference amplifier (DDA). Being the first work to propose a continuous-time gain calibration technique for RF amplifiers, the loop dynamics such as settling time, stability and control voltage ripples are analyzed by means of mathematical modeling of each circuit building block. As a result, a systematic design procedure is developed. In order to validate the concept, a 5.2-GHz variable-gain low-noise amplifier (LNA) is integrated with the proposed analog gain calibration loop for demonstration. By using a standard 0.18- μm CMOS process, the fabricated circuit consumes a total dc power of 18.5 mW from a 1.8-V supply, while the measured maximum gain error is less than 1 dB.
Keywords :
CMOS integrated circuits; calibration; low noise amplifiers; operational amplifiers; radiofrequency amplifiers; resistors; CMOS; LNA; RF amplifiers; analog gain calibration loop; analog on-line gain calibration loop; circuit building block; continuous-time gain calibration; differential difference amplifier; frequency 5.2 GHz; low-noise amplifier; mathematical modeling; power 18.5 mW; programmable resistor; radio-frequency amplifiers; size 0.18 mum; transimpedance amplifiers; voltage 1.8 V; Calibration; Detectors; Gain; Radio frequency; Resistors; Transfer functions; Voltage control; Amplitude detectors; RF amplifiers; built-in self-test (BIST); gain calibration; loop stability; transimpedance amplifiers (TIAs);
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2015.2440736