Title :
High current diode and SCR reliability considerations
Author :
Comstock, W.R. ; Locher, R.E.
Author_Institution :
Semiconductor Products Department, General Electric Company, USA
Abstract :
The intent of this paper is to serve as a designer´s guide to enable him to custom design-in the semiconductor reliability required by his power electronic circuit. Normal and special testing procedures to eliminate defective product are considered, along with guide lines to extend the useful life of the product. Successful applications are shown.
Keywords :
Junctions; Logic gates; Reliability; Resistance; Semiconductor diodes; Temperature measurement; Thyristors;
Conference_Titel :
Power Electronics Specialists Conference, 1975 IEEE
Conference_Location :
Culver City, California, USA
DOI :
10.1109/PESC.1975.7085586
