Title :
Rap session A - failure modes in power electronics
Author :
Mungenast, J. ; Schoop, Ernest ; Fury, Art ; Locher, Ralph ; Jednacz, Tom ; Vaughn, Eldon
Author_Institution :
Power Semiconductors, Inc., Devon, Connecticut, USA
Abstract :
In IEEE and PESC papers given in 1973 and 1974 the subject of Power Electronic reliability was explored. Past and potential problem areas were explored, and a survey of international users and manufacturers pointed out areas for further study.
Keywords :
Fuses; Integrated circuit reliability; Integrated circuits; Testing; Thyristors;
Conference_Titel :
Power Electronics Specialists Conference, 1975 IEEE
Conference_Location :
Culver City, California, USA
DOI :
10.1109/PESC.1975.7085602
