Title :
Electrical Overstress / Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347)
Abstract :
Presents the front cover and table of contents to the Electrical Overstress / Electrostatic Discharge Symposium Proceedings. 1998 (IEEE Cat. No.98TH8347).
Keywords :
circuit simulation; electrostatic discharge; integrated circuit technology; magnetic heads; magnetoresistive devices; protection; EOS; ESD; MR heads; circuit simulation; factory issues; materials; on-chip protection; semiconductor processes; system level issues;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1998
Conference_Location :
Reno, NV, USA
Print_ISBN :
1-878303-91-0
DOI :
10.1109/EOSESD.1998.737011
