Title :
Acoustoelectric Mobility Measurements on Films with Negligible Acoustic Loss
Author :
Adler, R. ; Janes, D. ; Datta, S. ; Hunsinger, B.J.
Keywords :
Acoustic measurements; Current measurement; Delay lines; Electrical resistance measurement; Loss measurement; Piezoelectric films; Semiconductor films; Substrates; Surface acoustic waves; Surface resistance;
Conference_Titel :
1980 Ultrasonics Symposium
DOI :
10.1109/ULTSYM.1980.197375