DocumentCode
2441047
Title
An experimental and theoretical consideration of physical design parameters in field-induced charged device model ESD simulators and their impact upon measured withstand voltages
Author
Carey, R.E. ; DeChiaro, L.F.
Author_Institution
Microelectron. Group, Lucent Technol., Reading, PA, USA
fYear
1998
fDate
6-8 Oct. 1998
Firstpage
40
Lastpage
53
Abstract
The effects of changing the physical design parameters of field-induced charged device model (FCDM) ESD simulators have been investigated experimentally and theoretically. The most critical parameter is the DUT-to-field plate spacing, followed by the DUT surface area. Total inductance is also important if the discharge loop is underdamped. These effects can help explain the differences observed between results achieved with the ESDA and JEDEC test modules and will assist the FCDM standardization effort.
Keywords
circuit simulation; electrostatic discharge; inductance; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; modules; standardisation; standards; surface charging; DUT surface area; DUT-to-field plate spacing; ESDA test modules; FCDM ESD simulators; FCDM standardization; JEDEC test modules; field-induced CDM ESD simulators; field-induced charged device model ESD simulators; inductance; physical design parameters; underdamped discharge loop; withstand voltages; Biological system modeling; Current measurement; Dielectric measurements; Electric variables; Electrostatic discharge; Inductance; Integrated circuit modeling; Predictive models; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1998
Conference_Location
Reno, NV, USA
Print_ISBN
1-878303-91-0
Type
conf
DOI
10.1109/EOSESD.1998.737020
Filename
737020
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