• DocumentCode
    2441068
  • Title

    Using focused regression for accurate time-constrained scaling of scientific applications

  • Author

    Barnes, Brad ; Garren, Jeonifer ; Lowenthal, David K. ; Reeves, Jaxk ; De Supinski, Bronis R. ; Schulz, Martin ; Rountree, Barry

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Georgia, Athens, GA, USA
  • fYear
    2010
  • fDate
    19-23 April 2010
  • Firstpage
    1
  • Lastpage
    12
  • Abstract
    Many large-scale clusters now have hundreds of thousands of processors, and processor counts will be over one million within a few years. Computational scientists must scale their applications to exploit these new clusters. Time-constrained scaling, which is often used, tries to hold total execution time constant while increasing the problem size along with the processor count. However, complex interactions between parameters, the processor count, and execution time complicate determining the input parameters that achieve this goal. In this paper we develop a novel gray-box, focused regression-based approach that assists the computational scientist with maintaining constant run time on increasing processor counts. Combining application-level information from a small set of training runs, our approach allows prediction of the input parameters that result in similar per-processor execution time at larger scales. Our experimental validation across seven applications showed that median prediction errors are less than 13%.
  • Keywords
    parallel programming; regression analysis; workstation clusters; computational scientist; focused regression; large-scale clusters; median prediction errors; per-processor execution time; processor count; time-constrained scaling; training runs; Accuracy; Application software; Computer science; Concurrent computing; Data structures; Laboratories; Large-scale systems; Parallel processing; Runtime; Statistics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Parallel & Distributed Processing (IPDPS), 2010 IEEE International Symposium on
  • Conference_Location
    Atlanta, GA
  • ISSN
    1530-2075
  • Print_ISBN
    978-1-4244-6442-5
  • Type

    conf

  • DOI
    10.1109/IPDPS.2010.5470431
  • Filename
    5470431