Title :
EOS analysis of soldering iron tip voltage
Author :
Baumgartner, G. ; Smith, Jack S.
Author_Institution :
ESD West Consulting, Mountain View, CA, USA
Abstract :
The soldering iron 2 mV requirement is deficient, flawed and impractical, and is not related to the electrical overstress (EOS) that will damage the most sensitive semiconductor devices. New requirements have been developed based on semiconductors and device physics. The analysis of soldering irons resulted in a protection method that was developed by using equivalent circuits. The requirements are set, based on the necessary conditions for the prevention of EOS, by setting the maximum permissible voltage and current. A case history is presented to show the analysis procedures used.
Keywords :
assembling; electrostatic discharge; equivalent circuits; integrated circuit reliability; printed circuit manufacture; protection; soldering; 2 mV; EOS analysis; EOS prevention; analysis procedures; device physics; electrical overstress; equivalent circuits; maximum permissible current; maximum permissible voltage; protection method; sensitive semiconductor devices; soldering iron tip voltage; soldering iron voltage requirement; soldering irons; Earth Observing System; Electrostatic discharge; Iron; Manufacturing; Military standards; Physics; Protection; Soldering; Space technology; Voltage;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1998
Conference_Location :
Reno, NV, USA
Print_ISBN :
1-878303-91-0
DOI :
10.1109/EOSESD.1998.737042
