• DocumentCode
    2441516
  • Title

    Efficient reuse of domain-specific test knowledge: An industrial case in the smart card domain

  • Author

    Devos, Nicolas ; Ponsard, Christophe ; Deprez, Jean-Christophe ; Bauvin, Renaud ; Moriau, Benedicte ; Anckaerts, Guy

  • Author_Institution
    Software & Syst. Eng., CETIC Res. Center, Charleroi, Belgium
  • fYear
    2012
  • fDate
    2-9 June 2012
  • Firstpage
    1123
  • Lastpage
    1132
  • Abstract
    While testing is heavily used and largely automated in software development projects, the reuse of test practices across similar projects in a given domain is seldom systematized and supported by adequate methods and tools. This paper presents a practical approach that emerged from a concrete industrial case in the smart card domain at STMicroelectronics Belgium in order to better address this kind of challenge. The central concept is a test knowledge repository organized as a collection of specific patterns named QPatterns. A systematic process was followed, first to gather, structure and abstract the test practices, then to produce and validate an initial repository, and finally to make it evolve later on Testers can then rely on this repository to produce high quality test plans identifying all the functional and nonfunctional aspects that have to be addressed, as well as the concrete tests that have to be developed within the context of a new project. A tool support was also developed and integrated in a traceable way into the existing industrial test environment. The approach was validated and is currently under deployment at STMicroelectronics Belgium.
  • Keywords
    program testing; project management; smart cards; software management; STMicroelectronics Belgium; domain specific test knowledge; industrial case; industrial test environment; smart card domain; software development projects; Concrete; Libraries; Security; Smart cards; Software; Testing; generation; patterns; smartcard; test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering (ICSE), 2012 34th International Conference on
  • Conference_Location
    Zurich
  • ISSN
    0270-5257
  • Print_ISBN
    978-1-4673-1066-6
  • Electronic_ISBN
    0270-5257
  • Type

    conf

  • DOI
    10.1109/ICSE.2012.6227107
  • Filename
    6227107