DocumentCode
2441516
Title
Efficient reuse of domain-specific test knowledge: An industrial case in the smart card domain
Author
Devos, Nicolas ; Ponsard, Christophe ; Deprez, Jean-Christophe ; Bauvin, Renaud ; Moriau, Benedicte ; Anckaerts, Guy
Author_Institution
Software & Syst. Eng., CETIC Res. Center, Charleroi, Belgium
fYear
2012
fDate
2-9 June 2012
Firstpage
1123
Lastpage
1132
Abstract
While testing is heavily used and largely automated in software development projects, the reuse of test practices across similar projects in a given domain is seldom systematized and supported by adequate methods and tools. This paper presents a practical approach that emerged from a concrete industrial case in the smart card domain at STMicroelectronics Belgium in order to better address this kind of challenge. The central concept is a test knowledge repository organized as a collection of specific patterns named QPatterns. A systematic process was followed, first to gather, structure and abstract the test practices, then to produce and validate an initial repository, and finally to make it evolve later on Testers can then rely on this repository to produce high quality test plans identifying all the functional and nonfunctional aspects that have to be addressed, as well as the concrete tests that have to be developed within the context of a new project. A tool support was also developed and integrated in a traceable way into the existing industrial test environment. The approach was validated and is currently under deployment at STMicroelectronics Belgium.
Keywords
program testing; project management; smart cards; software management; STMicroelectronics Belgium; domain specific test knowledge; industrial case; industrial test environment; smart card domain; software development projects; Concrete; Libraries; Security; Smart cards; Software; Testing; generation; patterns; smartcard; test;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Engineering (ICSE), 2012 34th International Conference on
Conference_Location
Zurich
ISSN
0270-5257
Print_ISBN
978-1-4673-1066-6
Electronic_ISBN
0270-5257
Type
conf
DOI
10.1109/ICSE.2012.6227107
Filename
6227107
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