Title :
Heterodyne detector for measuring the characteristics of elliptically polarized microwaves
Author :
Leipold, Frank ; Nielsen, Stefan ; Meo, Fernando
Author_Institution :
Assoc. EURATOM Riso Nat. Lab., Tech. Univ. of Denmark, Roskilde
Abstract :
We present the design and results of an innovative device which is capable of determining the three characteristic parameters of elliptically polarized light (ellipticity, angle of ellipticity and direction of rotation) for microwave radiation at a frequency of 105 GHz. The device consists of two perpendicularly oriented rectangular pickup waveguides to measure the electrical field in two orthogonal directions. The microwave frequency is mixed down by a heterodyne technique to frequencies on the order of 200 MHz. An oscilloscope is used to determine the relative amplitudes of the electrical fields and the phase shift between them, from which the three characteristic parameters are calculated. As an essential part of the commissioning, the device was used to characterize the polarizers of the transmission line for the collective Thompson scattering (CTS) experiment at ASDEX Upgrade. The measurements were also used to benchmark the modeling of the microwave propagation through the transmission line. Comparison between measurements and calculated wave characteristics show good agreement and are presented.
Keywords :
electromagnetic wave polarisation; heterodyne detection; microwave detectors; microwave propagation; oscilloscopes; ASDEX Upgrade; collective Thompson scattering; elliptically polarized light; elliptically polarized microwaves; frequency 105 GHz; frequency 200 MHz; heterodyne detector; microwave propagation; microwave radiation; oscilloscope; perpendicularly oriented rectangular pickup waveguides; polarizers; transmission line; Detectors; Electric variables measurement; Light scattering; Microwave devices; Microwave frequencies; Microwave measurements; Optical polarization; Oscilloscopes; Rectangular waveguides; Transmission line measurements;
Conference_Titel :
Plasma Science, 2008. ICOPS 2008. IEEE 35th International Conference on
Conference_Location :
Karlsruhe
Print_ISBN :
978-1-4244-1929-6
Electronic_ISBN :
0730-9244
DOI :
10.1109/PLASMA.2008.4591016