DocumentCode
2441720
Title
Ultra low impedance transmission line tester
Author
Chu, C.Y. ; Worley, E.R.
Author_Institution
Rockwell Semicond. Syst., Newport Beach, CA, USA
fYear
1998
fDate
6-8 Oct. 1998
Firstpage
311
Lastpage
319
Abstract
An ultra low impedance transmission line pulsing (TLP) technique is developed to characterize highly conductive ESD protection elements. It is shown that ultra low impedance TLP is superior to the traditional 50 /spl Omega/ TLP in getting stable I-V characteristics. Detection sensitivity of 10 m/spl Omega/ can be resolved.
Keywords
electric current; electric impedance; electrostatic discharge; protection; sensitivity; transmission lines; 50 ohm; conductive ESD protection elements; detection sensitivity; stable I-V characteristics; ultra low impedance TLP technique; ultra low impedance transmission line pulsing technique; ultra low impedance transmission line tester; Electrostatic discharge; Impedance; Power transmission lines; Protection; Pulse generation; Pulse transformers; Switches; Testing; Transmission lines; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1998
Conference_Location
Reno, NV, USA
Print_ISBN
1-878303-91-0
Type
conf
DOI
10.1109/EOSESD.1998.737051
Filename
737051
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