DocumentCode :
2441720
Title :
Ultra low impedance transmission line tester
Author :
Chu, C.Y. ; Worley, E.R.
Author_Institution :
Rockwell Semicond. Syst., Newport Beach, CA, USA
fYear :
1998
fDate :
6-8 Oct. 1998
Firstpage :
311
Lastpage :
319
Abstract :
An ultra low impedance transmission line pulsing (TLP) technique is developed to characterize highly conductive ESD protection elements. It is shown that ultra low impedance TLP is superior to the traditional 50 /spl Omega/ TLP in getting stable I-V characteristics. Detection sensitivity of 10 m/spl Omega/ can be resolved.
Keywords :
electric current; electric impedance; electrostatic discharge; protection; sensitivity; transmission lines; 50 ohm; conductive ESD protection elements; detection sensitivity; stable I-V characteristics; ultra low impedance TLP technique; ultra low impedance transmission line pulsing technique; ultra low impedance transmission line tester; Electrostatic discharge; Impedance; Power transmission lines; Protection; Pulse generation; Pulse transformers; Switches; Testing; Transmission lines; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1998
Conference_Location :
Reno, NV, USA
Print_ISBN :
1-878303-91-0
Type :
conf
DOI :
10.1109/EOSESD.1998.737051
Filename :
737051
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2441720
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