Title :
Evaluation of wrist strap monitors from an MR head perspective
Author :
Gocemen, Ferruh ; Szymanski, Mitch ; Salisbury, Jeff ; Sanchez, Mike
Author_Institution :
MKE-Quantum Components LLC, Shrewsbury, MA, USA
Abstract :
Magnetoresistive (MR) heads are very sensitive devices that can be damaged by applying a current that exceeds the normal bias current of the head, which is typically around 10 mA for anisotropic magnetoresistive (AMR) devices. Contact with the head from a charged object can cause damaging current transients. Depending on the magnitude of the charge, these currents can reach peak values of hundreds of milliamps during this very fast discharge. All monitors tested resulted in a voltage on the operator under worst case conditions. This worst case voltage was AC for capacitive monitors and DC or pulsed DC for resistive and charge detecting monitors. Under best case conditions, there was at least one monitor in each category that exhibited near zero voltage on the operator. If the operator is holding a pair of metal tweezers and makes contact with an MR head, the voltage on the operator will cause current transients that are potentially harmful to the head. By considering the advances in MR technology in recent years, the data in this paper aims to assist the end user in selecting the most suitable wrist strap monitoring technology.
Keywords :
electronic equipment testing; electrostatic discharge; magnetic anisotropy; magnetic heads; magnetoresistive devices; monitoring; static electrification; transient analysis; transients; 10 mA; AC operator voltage; AMR devices; DC operator voltage; MR head perspective; anisotropic magnetoresistive devices; capacitive monitors; charge detecting monitors; charged object contact; current damage; current transients; damaging current transients; discharge current; head bias current; magnetoresistive heads; metal tweezers; monitor testing; operator voltage; pulsed DC operator voltage; resistive monitors; sensitivity; worst case voltage; wrist strap monitoring technology; wrist strap static charge monitors; Anisotropic magnetoresistance; Cities and towns; Electrical resistance measurement; Magnetic heads; Monitoring; Performance evaluation; Resistors; Testing; Voltage; Wrist;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1998
Conference_Location :
Reno, NV, USA
Print_ISBN :
1-878303-91-0
DOI :
10.1109/EOSESD.1998.737055