DocumentCode :
2441844
Title :
Electromagnetic interference (EMI) damage to giant magnetoresistive (GMR) recording heads
Author :
Wallash, Al ; Smith, Doug
Author_Institution :
Quantum Corp., Milpitas, CA, USA
fYear :
1998
fDate :
6-8 Oct. 1998
Firstpage :
368
Lastpage :
374
Abstract :
It is shown that giant magnetoresistive (GMR) recording heads can be damaged by electromagnetic interference (EMI) from a remote electrostatic discharge (ESD) event. An EMI test board is described and used to quantify EMI damage thresholds for a dipole or loop antenna attached to a GMR head. A practical example of EMI damage during resistance measurement is studied. SEM failure analysis after EMI testing shows melting damage to the GMR sensor that is similar in appearance to the damage caused by direct-contact ESD damage. It is concluded that it is important to control EMI during handling operations that involve any wires connected to the GMR recording head.
Keywords :
dipole antennas; electromagnetic interference; electronic equipment testing; electrostatic discharge; failure analysis; giant magnetoresistance; loop antennas; magnetic heads; magnetic recording; magnetoresistive devices; materials handling; scanning electron microscopy; EMI control; EMI damage; EMI damage thresholds; EMI test board; EMI testing; GMR head; GMR recording head; GMR recording heads; GMR sensor; SEM failure analysis; connected wire handling; dipole antenna; direct-contact ESD damage; electromagnetic interference; electromagnetic interference damage; giant magnetoresistive recording heads; handling operations; loop antenna; melting damage; remote ESD event; remote electrostatic discharge event; resistance measurement; Dipole antennas; Disk recording; Electrical resistance measurement; Electromagnetic interference; Electrostatic discharge; Electrostatic interference; Failure analysis; Giant magnetoresistance; Magnetic heads; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1998
Conference_Location :
Reno, NV, USA
Print_ISBN :
1-878303-91-0
Type :
conf
DOI :
10.1109/EOSESD.1998.737058
Filename :
737058
Link To Document :
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