DocumentCode
2441950
Title
Automatic Time Domain Testing of SAW Devices
Author
Langecker, K. ; Veith, R.
fYear
1980
fDate
1980
Firstpage
396
Lastpage
399
Keywords
Automatic testing; Electromagnetic measurements; Frequency measurement; Frequency response; Measurement standards; Pulse measurements; Pulse modulation; Radio frequency; Surface acoustic wave devices; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
1980 Ultrasonics Symposium
Type
conf
DOI
10.1109/ULTSYM.1980.197427
Filename
1534367
Link To Document