DocumentCode :
2441950
Title :
Automatic Time Domain Testing of SAW Devices
Author :
Langecker, K. ; Veith, R.
fYear :
1980
fDate :
1980
Firstpage :
396
Lastpage :
399
Keywords :
Automatic testing; Electromagnetic measurements; Frequency measurement; Frequency response; Measurement standards; Pulse measurements; Pulse modulation; Radio frequency; Surface acoustic wave devices; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
1980 Ultrasonics Symposium
Type :
conf
DOI :
10.1109/ULTSYM.1980.197427
Filename :
1534367
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2441950
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