DocumentCode :
2442110
Title :
Comparison of 10 V calibrations between KRISS and ETL
Author :
Kyu-Tae Kim ; Sakamoto, Y. ; Sakuraba, T.
Author_Institution :
Korea Res. Inst. of Stand. & Sci., Taejon, South Korea
fYear :
1996
fDate :
17-21 June 1996
Firstpage :
236
Lastpage :
237
Abstract :
The results of an intercomparison of 10 V dc voltage standard calibrations between KRISS (Korea) and ETL (Japan) conducted from September to October in 1995 are described. A commercial Zener voltage standard (Fluke 732 B) owned by KRISS was hand-carried for the comparison. A preliminary analysis of the result is strongly implying the two 10 V calibration systems, both of which are based on 10:1 divider and l-V Josephson array are in good agreement within an uncertainty less than 0.05 ppm.
Keywords :
Josephson effect; calibration; measurement errors; measurement standards; superconducting junction devices; voltage measurement; 10 V; DC voltage standard; ETL; KRISS; Zener voltage standard; calibrations; l-V Josephson array; uncertainty; Batteries; Calibration; Circuits; Cities and towns; Laboratories; Linear regression; Resistors; Uncertainty; Voltage; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location :
Braunschweig, Germany
Print_ISBN :
0-7803-3376-4
Type :
conf
DOI :
10.1109/CPEM.1996.547048
Filename :
547048
Link To Document :
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