Title :
Integrated Models and Their Usage in Predicting the Signal Strength
Author :
Lee, David J. Y. ; Lee, William C. Y.
Author_Institution :
Cisco Syst., San Jose, CA, USA
Abstract :
There are many propagation models that address specific area and application´s needs. Each model works well in specific application with specific data and algorithm. Mobile users are now expecting more and more ubiquitous user experience. It is critical to have an integrated model that provides a complete solution for deployment and optimization for different environment and cell types. The Lee macro, micro and pico propagation models which covers different frequencies (900MHz, 1800 MHz, 2.4G and 5 G) and are validated with large amount of field data have been adopted in many deployments [1-7]. In this paper we integrate these three models to be used for deploying, and optimizing system coverage, interference, capacity and handoff across different cell types. Systems are designed and deployed with common input, algorithm and output. It is integrated with common measured data also to enhance the accuracy and flexibility of the model with reduced cost. Each Lee sub model is reviewed and compared with measured data to prove its accuracy. Then the integrated Lee model is used to do a complete system design with pico, micro and macro cells. The design is then compared with the ray tracing and Finite-difference time-domain (FDTD) techniques [8-10] to validate its applicability. Results show that integrated Lee models do provide an effective and accurate way for a complete system design.
Keywords :
Lee model; finite difference methods; mobile radio; radiowave propagation; Lee macro propagation model; Lee submodel; finite-difference time-domain technique; frequency 1800 MHz; frequency 2.4 GHz; frequency 5 GHz; frequency 900 MHz; integrated Lee model; micro propagation model; mobile users; pico propagation model; ray tracing; signal strength prediction; ubiquitous user experience; Buildings; Data models; Finite difference methods; Macrocell networks; Ray tracing; Solid modeling; Time-domain analysis;
Conference_Titel :
Vehicular Technology Conference (VTC Spring), 2014 IEEE 79th
Conference_Location :
Seoul
DOI :
10.1109/VTCSpring.2014.7022949