• DocumentCode
    2442521
  • Title

    Obstacle detection by recognizing binary expansion patterns

  • Author

    Baram, Yoram ; Barniv, Yair

  • Author_Institution
    Dept. of Comput. Sci., Technion-Israel Inst. of Technol., Haifa, Israel
  • Volume
    6
  • fYear
    1994
  • fDate
    27 Jun- 2 Jul 1994
  • Firstpage
    4175
  • Abstract
    This paper describes a technique for obstacle detection, based on the expansion of the image-plane projection of a textured object, as its distance from the sensor decreases. Information is conveyed by vectors whose components represent first-order temporal and spatial derivatives of the image intensity, which are related to the time to collision through the local divergence. Such vectors may be characterized as patterns corresponding to “safe” or “dangerous” situations. The authors show that the essential information is conveyed by single-bit vector components, representing the signs of the relevant derivatives. The authors use two previously developed, high capacity classifiers, employing neural learning techniques, to recognize the imminence of collision from such patterns
  • Keywords
    computer vision; image sequences; learning (artificial intelligence); neural nets; binary expansion patterns; high capacity classifiers; image intensity; image-plane projection; local divergence; neural learning techniques; obstacle detection; single-bit vector components; textured object; time to collision; Image motion analysis; Image sensors; Layout; NASA; Optical imaging; Optical sensors; Pattern recognition; Robot sensing systems; Sensor phenomena and characterization; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks, 1994. IEEE World Congress on Computational Intelligence., 1994 IEEE International Conference on
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-1901-X
  • Type

    conf

  • DOI
    10.1109/ICNN.1994.374884
  • Filename
    374884