DocumentCode
2442521
Title
Obstacle detection by recognizing binary expansion patterns
Author
Baram, Yoram ; Barniv, Yair
Author_Institution
Dept. of Comput. Sci., Technion-Israel Inst. of Technol., Haifa, Israel
Volume
6
fYear
1994
fDate
27 Jun- 2 Jul 1994
Firstpage
4175
Abstract
This paper describes a technique for obstacle detection, based on the expansion of the image-plane projection of a textured object, as its distance from the sensor decreases. Information is conveyed by vectors whose components represent first-order temporal and spatial derivatives of the image intensity, which are related to the time to collision through the local divergence. Such vectors may be characterized as patterns corresponding to “safe” or “dangerous” situations. The authors show that the essential information is conveyed by single-bit vector components, representing the signs of the relevant derivatives. The authors use two previously developed, high capacity classifiers, employing neural learning techniques, to recognize the imminence of collision from such patterns
Keywords
computer vision; image sequences; learning (artificial intelligence); neural nets; binary expansion patterns; high capacity classifiers; image intensity; image-plane projection; local divergence; neural learning techniques; obstacle detection; single-bit vector components; textured object; time to collision; Image motion analysis; Image sensors; Layout; NASA; Optical imaging; Optical sensors; Pattern recognition; Robot sensing systems; Sensor phenomena and characterization; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Neural Networks, 1994. IEEE World Congress on Computational Intelligence., 1994 IEEE International Conference on
Conference_Location
Orlando, FL
Print_ISBN
0-7803-1901-X
Type
conf
DOI
10.1109/ICNN.1994.374884
Filename
374884
Link To Document