DocumentCode
2442672
Title
Thermal-Wave-Microscopy: A New Application of the Scanning Electron Microscope
Author
Brandis, E.K.
fYear
1980
fDate
1980
Firstpage
608
Lastpage
609
Keywords
Amplifiers; Electron beams; Frequency modulation; Optical microscopy; Optical modulation; Photothermal effects; Scanning electron microscopy; Scattering; Signal generators; Transmission electron microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
1980 Ultrasonics Symposium
Type
conf
DOI
10.1109/ULTSYM.1980.197470
Filename
1534410
Link To Document