DocumentCode
2442958
Title
Fabrication of precision quantised Hall devices
Author
Inglis, A.D. ; Minowa, I.
Author_Institution
Inst. for Nat. Meas. Stand., Nat. Res. Council of Canada, Ottawa, Ont., Canada
fYear
1996
fDate
17-21 June 1996
Firstpage
245
Lastpage
246
Abstract
Produces a series of quantised Hall resistors suitable for high precision measurements in fields below 9 tesla. Critical currents on both steps are in excess of 100 /spl mu/A.We have optimised the structure and treatment ofthe AuGeNi contacts to give four-probe contact resistance values of 2 m/spl omega/. These contact resistance values are amongst the lowest reported.
Keywords
Hall effect devices; contact resistance; critical currents; electric resistance measurement; measurement standards; quantum Hall effect; quantum interference devices; 2 mohm; AuGeNi; Hall resistors; critical currents; four-probe contact resistance values; precision quantised Hall devices; resistance standards; Contact resistance; Councils; Current measurement; Fabrication; Magnetic field measurement; Magnetic fields; Measurement standards; Noise measurement; Resistors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location
Braunschweig, Germany
Print_ISBN
0-7803-3376-4
Type
conf
DOI
10.1109/CPEM.1996.547053
Filename
547053
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