DocumentCode :
2443261
Title :
Investigation of noise effects of CMS laser lineshape and frequency fluctuations
Author :
Saktioto ; Irawan, Dedi ; Hamdi, Muhamad ; Zainal, Jasman ; Ali, Jalil
Author_Institution :
Adv. Photonics Sci. Inst., Univ. Teknol. Malaysia, Skudai, Malaysia
fYear :
2011
fDate :
25-28 Sept. 2011
Firstpage :
464
Lastpage :
468
Abstract :
Lineshape and frequency fluctuations actually cause the optical field of current modulation semiconductor laser (CMS) laser beam to deviate from a pure sine wave [1]. This paper investigates the lineshape of a CMS laser for two distinct types of frequency noise. In the first case the investigation analyzes on the low-pass filter, the frequency noise level is a constant δo below a cutoff frequency but zero above this threshold. In the second case on high-pass filter the frequency noise level is a constant δo above a cutoff frequency but zero below this threshold. Investigations observed inspire us to focus for separation of the frequency noise spectrum into two regions wherein due to the effect of noise on the lineshape is radically different in the slow modulation area in a left side of the diagonal line where the noise contributes to the laser linewidth, with a Gaussian shape, and the other one the fast modulation area in a right side of the diagonal line, where the noise contributes only to the wings of the line (sidebands) and not to the linewidth, thus transforming the lineshape from Gaussian to Lorentzian.
Keywords :
fluctuations; high-pass filters; laser beams; laser noise; low-pass filters; optical filters; optical modulation; semiconductor lasers; spectral line breadth; CMS laser lineshape; Gaussian shape; Lorentzian lineshape; current modulation semiconductor laser beam; cutoff frequency; frequency fluctuations; frequency noise; high-pass filter; laser linewidth; low-pass filter; optical field; sine wave; Correlation; Cutoff frequency; Frequency modulation; Laser noise; Laser theory; Optical filters; CMS laser; Gaussian; frequency; investigation; lineshape; noise effect;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Business, Engineering and Industrial Applications (ISBEIA), 2011 IEEE Symposium on
Conference_Location :
Langkawi
Print_ISBN :
978-1-4577-1548-8
Type :
conf
DOI :
10.1109/ISBEIA.2011.6088859
Filename :
6088859
Link To Document :
بازگشت