DocumentCode :
2443377
Title :
ZnO Film Analysis
Author :
McAvoy, B.R.
fYear :
1980
fDate :
1980
Firstpage :
809
Lastpage :
812
Keywords :
Chemical analysis; Diodes; Optical films; Piezoelectric films; Scanning electron microscopy; Spectroscopy; Sputtering; X-ray diffraction; X-ray scattering; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
1980 Ultrasonics Symposium
Type :
conf
DOI :
10.1109/ULTSYM.1980.197510
Filename :
1534450
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2443377