Title :
Semi-Adaptive Approach to the Extraction of Low-Frequency Properties from Scattering Measurements
Author :
Richardson, J.M. ; Elsley, R.K.
Keywords :
Acoustic noise; Acoustic scattering; Force measurement; Frequency estimation; Frequency measurement; Low-frequency noise; Noise measurement; Rayleigh scattering; Ultrasonic variables measurement; Wavelength measurement;
Conference_Titel :
1980 Ultrasonics Symposium
DOI :
10.1109/ULTSYM.1980.197518