Title :
Multi-layer perceptron ensembles for pattern recognition: some experiments
Author :
Costa, M. ; Filippi, E. ; Pasero, E.
Author_Institution :
Dipartimento di Elettronica, Politecnico di Torino, Italy
fDate :
27 Jun-2 Jul 1994
Abstract :
All global optimization methods trying to select the best model for a given task have to face the problem of the bias introduced during learning by several factors (e.g., overfitting problems or local minima) which may lead to poor generalization. Multiple models can reduce this problem by combining the results of a population of differently trained networks. Unfortunately, nonlinear adaptive systems like multilayer perceptrons cannot be integrated in the parameter (weight) space. Therefore, a key issue in the development of efficient network ensembles is the trade-off between performance improvement and the required resource overhead with respect to standard optimal model selection techniques. In this work several approaches to the design of multiple multilayer perceptrons classifiers are compared, and their robustness to some implementation constraints is evaluated
Keywords :
learning (artificial intelligence); multilayer perceptrons; optimisation; pattern recognition; global optimization methods; learning; multilayer perceptron ensembles; multiple multilayer perceptrons classifiers; nonlinear adaptive systems; pattern recognition; Adaptive systems; Backpropagation algorithms; Computational Intelligence Society; Hardware; Multidimensional systems; Multilayer perceptrons; Pattern recognition; Robustness; Sampling methods; Standards development;
Conference_Titel :
Neural Networks, 1994. IEEE World Congress on Computational Intelligence., 1994 IEEE International Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-1901-X
DOI :
10.1109/ICNN.1994.374945