Title :
In-situ TEM investigation of stepping motion of telescoping carbon nanotube
Author :
Ode, Yasuhito ; Nakajima, Masahiro ; Yang, Zhan ; Saito, Yahachi ; Fukuda, Toshio
Author_Institution :
Dept. of Micro-Nano Syst. Eng., Nagoya Univ., Nagoya, Japan
Abstract :
We report the stepping reinsertion motion of inner core of telescoping nanotube by In-situ transmission electron microscope (TEM) nanomanipulation. The telescoping nanotubes are fabricated through electrical breakdown at the tip of nanotubes using contact resistance. The smooth reinsertion motion of the core was also observed at long telescoping nanotube. The motion is considered to be caused by the curvature of the outer shells and the gap between the axes of the nanotube and pushing force. As next generational nanoelectro-mechanical systems (NEMS), the stepping motion has a possibility to use for the stepping motion of nanoactuator using telescoping nanotubes.
Keywords :
carbon nanotubes; electromechanical actuators; nanofabrication; transmission electron microscopy; In-situ TEM Investigation; NEMS; contact resistance; electrical breakdown; in-situ transmission electron microscope nanomanipulation; nanoactuator; nanoelectromechanical systems; nanofabrication; stepping motion; telescoping carbon nanotubes; Contamination; Electrodes; Manipulators; Microscopy; Probes; Surface treatment; Tungsten;
Conference_Titel :
System Integration (SII), 2010 IEEE/SICE International Symposium on
Conference_Location :
Sendai
Print_ISBN :
978-1-4244-9316-6
DOI :
10.1109/SII.2010.5708336