Title :
Texture analysis for foreign object detection using a single layer neural network
Author :
Patel, D. ; Hannah, I. ; Davies, E.R.
Author_Institution :
Dept. of Phys., R. Holloway & Bedford New Coll., Egham, UK
fDate :
27 Jun-2 Jul 1994
Abstract :
Inspection of food products for quality control to ensure that products are free from impurities (foreign objects) such as stone, glass or metal is a demanding part of a production process. This paper presents a method to detect foreign objects in bags of frozen vegetables and in particular using bags of frozen corn kernels. X-ray imaging is used to view the contents of the bag. We use principal component analysis (PCA) techniques to find the orthogonal vectors in data space that account for as much as possible of the variance of the data. The vectors are then used as the coefficients of the convolution masks. We briefly mention the various texture analysis methods using PCA and describe the artificial neural network texture description method used in this study
Keywords :
X-ray imaging; automatic optical inspection; computer vision; food processing industry; image texture; neural nets; object recognition; X-ray imaging; convolution masks; food processing industry; foreign object detection; orthogonal vectors; principal component analysis; quality control; single layer neural network; texture analysis; Food products; Glass; Impurities; Inspection; Kernel; Object detection; Principal component analysis; Production; Quality control; X-ray imaging;
Conference_Titel :
Neural Networks, 1994. IEEE World Congress on Computational Intelligence., 1994 IEEE International Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-1901-X
DOI :
10.1109/ICNN.1994.374951