• DocumentCode
    2444129
  • Title

    Scaling effect research on micro-machined gas-pendulum dual-axis tilt sensors

  • Author

    Chen, Chen ; Han, Qiushi ; Zhang, Fuxue

  • Author_Institution
    China Acad. of Machine Sci. & Technol., Beijing
  • fYear
    2008
  • fDate
    Nov. 30 2008-Dec. 3 2008
  • Firstpage
    301
  • Lastpage
    306
  • Abstract
    This paper describes the scaling effect on the micro-machined gas-pendulum dual-axis tilt sensor from two aspects, microscale gas flow and microsystem technology, based on the design, fabrication and capability of the sensor; detailedly founds the theory model and analysis method of the sensor miniaturization in every stage whose demarcation points are 0.25 mum and 0.5 mum; simulates the gas flow in the continuous medium hypothesis. This paper analyses the effect of surface-area-to-volume ratio increase, surface roughness, viscous force etc on the gas flow of the micro sensor. This paper computes tests and experiments the residual stress of the electrodes and multilayer films of this sensor, puts forward the method to eliminate residual stress, solves the problem that films break off in the process of chip fabrication. The harvest of this paper is very important to farther micromation and improving capability of micro-machined gas-pendulum dual-axis tilt sensors.
  • Keywords
    gas sensors; microsensors; continuous medium hypothesis; micro sensor; micro-machined gas-pendulum dual-axis tilt sensors; microscale gas flow; microsystem technology; scaling effect research; sensor miniaturization; surface roughness; surface-area-to-volume ratio increase; viscous force; Analytical models; Computational modeling; Fabrication; Fluid flow; Force sensors; Gas detectors; Residual stresses; Rough surfaces; Sensor phenomena and characterization; Surface roughness; gas-pendulum; micro-machined; scaling effect; tilt sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensing Technology, 2008. ICST 2008. 3rd International Conference on
  • Conference_Location
    Tainan
  • Print_ISBN
    978-1-4244-2176-3
  • Electronic_ISBN
    978-1-4244-2177-0
  • Type

    conf

  • DOI
    10.1109/ICSENST.2008.4757118
  • Filename
    4757118