DocumentCode :
2444175
Title :
Ultrasonic Nonlinearity Parameters of Silicon Between 300 and 4° K
Author :
Phillip, J. ; Breazeale, M.A.
fYear :
1980
fDate :
1980
Firstpage :
1006
Lastpage :
1008
Keywords :
Electrodes; Jacobian matrices; Optical receivers; Partial differential equations; Physics; Silicon; Temperature dependence; Temperature measurement; Ultrasonic variables measurement; Velocity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
1980 Ultrasonics Symposium
Type :
conf
DOI :
10.1109/ULTSYM.1980.197549
Filename :
1534489
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2444175
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