Title :
Acoustic Properties of Amorphous SiHx-Films
Author :
Haumeder, M.V. ; Bhatia, K.L. ; Hunklinger, S.
Keywords :
Absorption; Amorphous materials; Annealing; Attenuation; Mechanical factors; Semiconductor thin films; Sputtering; Substrates; Surface acoustic wave devices; Thin film devices;
Conference_Titel :
1980 Ultrasonics Symposium
DOI :
10.1109/ULTSYM.1980.197556