DocumentCode :
2444424
Title :
A New Ultrasonic Method for Measuring the Shear Modulus of Thin Interface Films
Author :
Rokhlin, S. ; Rosen, M.
fYear :
1980
fDate :
1980
Firstpage :
1053
Lastpage :
1058
Keywords :
Boundary conditions; Capacitive sensors; Equations; Frequency measurement; H infinity control; Substrates; Surface waves; Tensile stress; Tires; Ultrasonic variables measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
1980 Ultrasonics Symposium
Type :
conf
DOI :
10.1109/ULTSYM.1980.197560
Filename :
1534500
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2444424
بازگشت